In 2024, a peer-reviewed study introduced improvements to the replica tape test method including an increased range for Coarse, X-Coarse, and X-Coarse Plus replica tapes and a new conversion technique. The resultant conversion table can be used with analog micrometers and provides a simpler alternative to the legacy ‘averaging’ technique. The conversion table is not required for the Testex Digital Micrometer as it makes the calculations automatically.
Previously, if readings made with either the legacy Coarse or X-Coarse replica tape fell within the 'overlap range' of 38 to 64 µm (1.5 to 2.5 mils), a second reading was be taken in the same spot with the other grade of tape. If BOTH readings were within the above 'overlap range’, the average of the two readings were recorded as the ‘Profile Measurement’. If only one reading was outside of the Overlap Range, it was recorded as the first reading and a second reading was taken with the same grade of replica tape. Averaging those two readings together yielded a 'Profile Measurement'. The legacy averaging technique is still valid and supported by international standards.